Results of the analysis of semiconductor paints and the in situ analysis of paintings using Fluorescence Lifetime Imaging (FLIM) were presented by Austin Nevin at the Joint Conference of the Scientific Research Working Group and Painting Working Group of the ICOM-CC entitled “The Non-Invasive Analysis of Painted Surfaces”.

Presentations given at the well-attended international conference can be viewed online. A full-length publication by the Smithsonian Institute will be produced as a result of the conference (to be printed in 2015).